The main conference will be held 17-18th June 2026 with a training day held on 16th June 2026.
09:00 Conference opens
09:30 Welcome address from Dr James Robinson, Associate Professor in Advanced Propulsion, Advanced Propulsion Lab, and Dr Francesco Iacoviello, Experimental Manager, X-Ray CT Imaging Facility, Electrochemical Innovation Lab
SESSION 1 – Standards, Traceability & Uncertainty in Dimensional XCT
10:00 KEYNOTE 1 – Leonardo De Chiffre – Applications and traceability aspects of industrial CT
10:30 Michael McCarthy – Verification test-pieces being considered for inclusion in an ISO Technical Specification (TS) for verification of dimensional XCT systems
10:50 Jonathan Plews, Nikon– Testing of a Prototype “Ball-Plate” Style Reference Standard for Comparable Validation of System Maximum Permissible Error
11:10 Coffee break and networking
11:40 David Gorman, NPL – Addressing measurement challenges in additive manufacturing: A modular artefact-centred platform for validation of XCT workflows
12:00 Verena Margitta, Universidad Nacional Autónoma de México – A bimodal tomographic reconstruction technique combining x-ray radiographies and 3D acoustic data for enhanced dimensional analysis
12:20 Poster presentation fast track
12:40 Gold sponsor talk – Thermo Fisher Scientific, Kevin Chrispeels – Exploration of complex deformations using advanced DVC analysis
12:55 Lunch and networking
SESSION 2 – Metrology Characteristics & System Performance
14.00 KEYNOTE 2 – Antoine Klos, IMDEA Materials Institute – Quantifying Local Information Loss in AI-Boosted X-Ray Tomography
14:30 Holger Roth, Waygate Technologies – Evaluation of CT System Performance Using Detail Detection Sensitivity in Accordance with ASTM E3505
14:50 Sunday Nwokolo, Bangor University – Beam-Hardening Predictive Index for Selection of Tube Voltage and Beam Filtration in X-ray Computed Tomography
15:10 dXCT AGM
15:25 Gold sponsor talk – RX solutions, Roland Le Floc’h– Enhancing Performance for Dimensional CT Measurement Applications
15:40 Coffee break and networking
15:55 Poster session
16:10 Raoul Christoph, Werth – Application of Simulation-Based Cone Beam Artefact Correction for Low Probing Errors in Computed Tomography in Accordance with VDI/VDE 2630-1.3
16:30 Robin Trostorf, PTB – Impact of Slice-based Volume data Compression on dimensional industrial CT Metrology
16:50 Bronze sponsor talk – Photonic Science
16:50 Day 1 closing announcements
18:45 Conference dinner – Capital Pleasure Boats – Boarding 18.45, departure 19.00
09:00 Conference opens
09:20 Day 2 announcements
SESSION 3 – Advanced XCT Technologies & Modelling Approaches
09:30 KEYNOTE 3 – Nicholas Bazin, AWE – AWE Nuclear Security Technologies Road to High Energy X-ray Computed Tomography
10:00 Nick Brierley, Diondo – Algorithmic CT-Scan Geometry Optimisation & Fixtures from Sample CAD Models
10:20 Ankit Singh Bhadauriya, Indian Institute of Technology Roorkee – Performance Testing and Comparison of X-ray Micro Computed Tomography Systems
10:40 Gold sponsor talk – Nikon, Chris Price – Enhancing Reliability and Consistency: Fully Automated X-ray Source Optimisation
10:55 Coffee break and networking
11:25 Genevieve Jenking-Rees, UCL – A Metrology framework for Quantitative Beam-Tracking X-ray Phase Contrast Tomography
11:45 Samuel Harris, University of Warwick – U-Net going to believe this: Metrology Focused Evaluation of a U-Net Inspired sparse-view XCT Projection Refinement Method
12:05 Evan Kiely, University of Warwick – Metrology of a laser driven x-ray source for CT imaging
12:25 Gold sponsor talk – Zeiss, Ivan BrittoIvan Britto – Inside the Battery: Data Driven X-Ray Insights for the Next Generation of Energy Storage
12:40 Lunch and networking
13:40 Silver sponsor talks
SESSION 4 – Applications of Dimensional XCT in Complex Systems
14:05 KEYNOTE 4 – Marcin Krawczyk, Cracow University of Technology – Challenges using XCT Systems for Coordinate Measurement
14:35 Shunli He, UCL – Quantifying Cycling-Induced Microstructural Degradation in Sodium-Ion Cathodes by X-ray µ-CT
14:55 Darragh Broadbent, NPL – Traceable Measurement of Additively Manufactured Components using a Comparator Method
15:15 Gold sponsor talk – Deben, Stephen Zeller – Advances in In-Situ Techniques – Understand More About Your Samples
15:30 Coffee break and networking
16:30 XCT Community Updates (CCPi, NXCT, MetHub)
16:45 Awards and closing remarks
17:00 End of conference